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Defect Characterization in Irradiated Nanocrystalline Materials via Automated Crystal Orientation Mapping

  • Pranav K. Suri (a1), James E. Nathaniel (a1), Christopher M. Barr (a1) (a2), Jon K. Baldwin (a3), Khalid Hattar (a2) and Mitra L. Taheri (a1)...
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[1] Ackland, G. Science 327 2010 1587.
[2] Beyerlein, I. J., et al, Mater. Today 16 2013 443.
[3] Bai, X. -M., et al, Science 327 2010 1631.
[4] Beyerlein, I. J., et al, Prog. Mater. Sci 74 2015 125.
[5] Jenkins, M. L. & Kirk, M. A. Characterization of Radiation Damage by Transmission Electron Microscopy. CRC Press 2000.
[6] Rauch, E. F. & Veron, M. Mater. Charact 98 2014 1.
[7] This work at the Drexel University is supported by the United States Department of Energy, Basic Energy Sciences under the Early Career program through contract DE-SC0008274. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.

Defect Characterization in Irradiated Nanocrystalline Materials via Automated Crystal Orientation Mapping

  • Pranav K. Suri (a1), James E. Nathaniel (a1), Christopher M. Barr (a1) (a2), Jon K. Baldwin (a3), Khalid Hattar (a2) and Mitra L. Taheri (a1)...

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