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Deconvolution Process of High-Resolution HAADF STEM Images

Published online by Cambridge University Press:  01 August 2002

M. Shiojiri ,
K. Watanabe ,
N. Nakanishi ,
T. Yamazaki ,
M. Kawasaki ,
A. Recnik  and
M. Ceh
M. Shiojiri
Affiliation:
Kyoto Institute of Technology, 606-8585, Japan
K. Watanabe
Affiliation:
Tokyo Metropolitan College of Technology, 140-0011, Japan
N. Nakanishi
Affiliation:
Department of Physics, Tokyo University of Science, 162-8601, Japan
T. Yamazaki
Affiliation:
Department of Physics, Tokyo University of Science, 162-8601, Japan
M. Kawasaki
Affiliation:
JEOL USA Inc. Dearborn Road, MA. 01960
A. Recnik
Affiliation:
Institute of Jožef Stefan, 1000 Ljubljana, Slovenia
M. Ceh
Affiliation:
Institute of Jožef Stefan, 1000 Ljubljana, Slovenia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 492 - 493
Copyright
Copyright © Microscopy Society of America 2002