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Cryo-EXLO for Cryo-TEM of FIB Specimens

Published online by Cambridge University Press:  22 July 2022

Lucille A. Giannuzzi ,
Michael Colletta ,
Yue Yu ,
Lena F. Kourkoutis ,
Andrew D. Iams ,
Kyle Beggs  and
Alain J. Kassab
Lucille A. Giannuzzi*
Affiliation:
EXpressLO LLC, Lehigh Acres, FL, USA
Michael Colletta
Affiliation:
Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Yue Yu
Affiliation:
Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Lena F. Kourkoutis
Affiliation:
Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY USA
Andrew D. Iams
Affiliation:
Materials Science & Engineering, The Pennsylvania State University, University Park, PA, USA
Kyle Beggs
Affiliation:
Mechanical & Aerospace Engineering, University of Central Florida, Orlando, FL, USA
Alain J. Kassab
Affiliation:
Mechanical & Aerospace Engineering, University of Central Florida, Orlando, FL, USA
*
*Corresponding author: Lucille.Giannuzzi@EXpressLO.com

Abstract

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Type
Technical Advances in Cryo-EM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1244
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Copyright
Copyright © Microscopy Society of America 2022

References

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This work was funded by DOE BER SBIR award DE-SC0020511. Additional support was provided by NSF (DMR-1654596, DMR-1429155, DMR-1719875).Google Scholar