Hostname: page-component-84b7d79bbc-4hvwz Total loading time: 0 Render date: 2024-07-31T09:57:14.679Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative Microscopy: Progress in Simultaneous Atomic-column XEDS and EELS, using a Monochromated, Aberration-corrected STEM

Published online by Cambridge University Press:  26 July 2009

DC Bell ,
R Schillinger ,
S Meyer  and
P Tayebati
DC Bell
Affiliation:
Harvard University
R Schillinger
Affiliation:
Carl Zeiss SMT,Inc
S Meyer
Affiliation:
Carl Zeiss SMT,Inc
P Tayebati
Affiliation:
Carl Zeiss SMT,Inc

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 472 - 473
Copyright
Copyright © Microscopy Society of America 2009