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Correcting Systematic Energy Deficits in the Laser-pulsed Atom Probe Mass Spectrum of SiO2

Published online by Cambridge University Press:  30 July 2020

Benjamin Caplins ,
Paul Blanchard ,
Ann Chiaramonti ,
David Diercks ,
Luis Miaja-Avila  and
Norman Sanford
Benjamin Caplins
Affiliation:
NIST, Boulder, Colorado, United States
Paul Blanchard
Affiliation:
NIST, Boulder, Colorado, United States
Ann Chiaramonti
Affiliation:
NIST, Boulder, Colorado, United States
David Diercks
Affiliation:
Colorado School of Mines, Golden, Colorado, United States
Luis Miaja-Avila
Affiliation:
NIST, Boulder, Colorado, United States
Norman Sanford
Affiliation:
NIST, Boulder, Colorado, United States

Abstract

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Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2880 - 2881
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Copyright
Copyright © Microscopy Society of America 2020

References

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Chiaramonti, A. et al. , MRS Adv. 4 (2019), p. 2367.10.1557/adv.2019.296CrossRefGoogle Scholar
This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar