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Correcting STEM distortions in atomically resolved elemental maps

Published online by Cambridge University Press:  30 July 2021

Pavel Potapov ,
Axel Lubk ,
Martin Kamp ,
Martin Stuebinger ,
Ralph Claessen  and
Michael Sing
Pavel Potapov
Affiliation:
IFW-Dresden, Dresden, Sachsen, Germany
Axel Lubk
Affiliation:
IFW Dresden, Germany, United States
Martin Kamp
Affiliation:
Julius-Maximilians-University, United States
Martin Stuebinger
Affiliation:
Julius-Maximilians-University, United States
Ralph Claessen
Affiliation:
Julius-Maximilians-University, United States
Michael Sing
Affiliation:
Julius-Maximilians-University, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 596 - 598
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Schuetz, P. et al. Applied Physics Letters 116 (2020) 201601.CrossRefGoogle Scholar
Wang, Y. et al. Microscopy and Microanalysis 23(S1) (2017) 408.CrossRefGoogle Scholar
Wang, Y. et al. Microscopy 67 (2018) i114, https://doi.org/10.1093/jmicro/dfy002CrossRefGoogle Scholar