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Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM
Published online by Cambridge University Press: 27 August 2014
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- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1118 - 1119
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- Copyright © Microscopy Society of America 2014
References
[2]
Liebel, A., et al., Microscopy & Microanalysis, vol. 19, S2 (2013), pp. 1134-1135.Google Scholar
[3]
Liebel, A., et al., Microscopy & Microanalysis, vol. 18, S2 (2012), pp. 1206-1207.Google Scholar
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