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Compressively Sensed Video Acquisition in Transmission Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

Bryan W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
Sang Tae Park
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
Ruth S. Bloom
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
Daniel J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Candes, E. J. & Tao, T. IEEE Trans. Information Theory 52 2006). p. 5406.CrossRefGoogle Scholar
[2] Zhou, M., et al IEEE Trans. Image Proc 21 2012). p. 130.Google Scholar
[3] LaGrange, T., Reed, B. W. & Masiel, D. J. MRS Bull 40 2015). p. 22.CrossRefGoogle Scholar
[4] This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Award Number DE-SC0013104.Google Scholar
[5] Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000..Google Scholar