Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-19T13:54:27.122Z Has data issue: false hasContentIssue false
  • English
  • Français

Compressed Sensing Inspired Line Feature Detection for In-Situ Transmission Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Haoyang Ni ,
Aram Yoon  and
Jian-Min Zuo
Haoyang Ni
Affiliation:
University of Illinois at Urbana-Champaign, United States
Aram Yoon
Affiliation:
Center for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan 44919, Republic of Korea, United States
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2218 - 2219
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Schwartz, J., Jiang, Y., Wang, Y., Aiello, A., Bhattacharya, P., Yuan, H., Mi, Z., Bassim, N. & Hovden, R. (2019). Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing. Microscopy and Microanalysis 25, 705–710.Google Scholar
Work supported by Strategic Research Initiative of College of Engineering, University of Illinois Urbana-ChampaignGoogle Scholar