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Complementing Secondary Ion Mass Spectrometry with other Ion-, Electron-and Photon-based Analytical Microscopies

Published online by Cambridge University Press:  25 July 2016

F. Horréard ,
P. Peres ,
A. Merkulov  and
D.J. Larson
F. Horréard
Affiliation:
CAMECA, 29 Quai des Grésillons, 92622 Gennevilliers, France.
P. Peres
Affiliation:
CAMECA, 29 Quai des Grésillons, 92622 Gennevilliers, France.
A. Merkulov
Affiliation:
CAMECA, 29 Quai des Grésillons, 92622 Gennevilliers, France.
D.J. Larson
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 342 - 343
Copyright
© Microscopy Society of America 2016 

References

[1] Meura, K.-A.B.-T., et al., in Ion Implantation Technology (IIT), 2014 20th International Conference on , vol., no., pp.1-4 , June 26 2014-July 4 2014.Google Scholar
[2] Seol, J. B., et al., Met. Mater. Int. Vol. 17(No. 3 (2011). pp. 413–416.CrossRefGoogle Scholar
[3] Lozano-Perez, Sergio, et al., Acta Materialia 57 (2009) 5361–5381.CrossRefGoogle Scholar
[4] Blanc, Wilfried, et al., November 2012 / Vol. 2, No. 11 / Optical Materials Express 1504.CrossRefGoogle Scholar