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Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films

  • Jim Fitch (a1), Robbyn Trappen (a2), Chih-Yeh Huang (a2), Jinling Zhou (a2), Guerau Cabrera (a2), Shuai Dong (a3), Shalini Kumari (a2), Mikel B. Holcomb (a2) and James M. LeBeau (a1)...
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[1] Moritomo, Y., et al, Nature 380 1996). pp. 141.
[2] Vailionis, A., et al, Phys. Rev. B 83 2011). p. 64101.
[3] Aruta, C., et al, Phys. Rev. B 73 2006). p. 235121.
[4] Pailloux, F., et al, Phys. Rev. B 66 2002). p. 14417.
[5] Samet, L., et al, Eur. Phys. J. B - Condens. Matter Complex Syst. 34 2003). pp. 179.
[6] Shouliang, Z., et al, American Mineralogist 95 2010). p. 1741.
[7] Sang, X., et al, Ultramicroscopy 138 2014). pp. 28.
[8] Nord, M., et al, Appl. Phys. Lett. 106 2015). p. 041604.
[9] This work is supported by the National Science Foundation (DMR-1608656). The authors also acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation..

Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films

  • Jim Fitch (a1), Robbyn Trappen (a2), Chih-Yeh Huang (a2), Jinling Zhou (a2), Guerau Cabrera (a2), Shuai Dong (a3), Shalini Kumari (a2), Mikel B. Holcomb (a2) and James M. LeBeau (a1)...

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