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Characterizing Epitaxial Growth of Nd2Ir2O7Pyrochlore Thin Films via HAADF-STEM Imaging and EDX

Published online by Cambridge University Press:  25 July 2016

B. D. Esser ,
J. C. Gallagher ,
R. Morrow ,
S. R. Dunsiger ,
R. E. A. Williams ,
P. M. Woodward ,
F. Y. Yang  and
D. W. McComb
B. D. Esser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
J. C. Gallagher
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, USA
R. Morrow
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, USA
S. R. Dunsiger
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, USA
R. E. A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
P. M. Woodward
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, USA
F. Y. Yang
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, USA
D. W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1598 - 1599
Copyright
© Microscopy Society of America 2016 

References

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[7] Funding for this research was provided by the Center for Emergent Materials at the Ohio State University, an NSF MRSEC (Award Number DMR-1420451).Google Scholar