Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-18T06:11:56.464Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of TiAl diffusion bonds using Ni/Ti nanolayers

Published online by Cambridge University Press:  14 March 2016

Sónia Simões ,
Filomena Viana ,
Ana Sofia Ramos ,
Maria Teresa Vieira  and
Manuel F. Vieira
Sónia Simões
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal.
Filomena Viana
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal.
Ana Sofia Ramos
Affiliation:
CEMUC, Department of Mechanical Engineering, University of Coimbra, R. Luís Reis Santos, 3030-788 Coimbra, Portugal.
Maria Teresa Vieira
Affiliation:
CEMUC, Department of Mechanical Engineering, University of Coimbra, R. Luís Reis Santos, 3030-788 Coimbra, Portugal.
Manuel F. Vieira
Affiliation:
CEMUC, Department of Metallurgical and Materials Engineering, University of Porto, R. Dr. Roberto Frias, 4200-465 Porto, Portugal.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Material Sciences
Information
Microscopy and Microanalysis , Volume 22 , Issue S4: 4th Joint Congress of the Portuguese and Spanish Microscopy Societies: mfs2015 - Microscopy at the Frontiers of Science , March 2016 , pp. 54 - 55
Copyright
Copyright © Microscopy Society of America 2016 

References

[1]Wu, X., Intermetallics 14 (2006). p. 1114.Google Scholar
[2]Clemens, H. & Mayer, S., Advanced Engineering Materials 15 (2013). p. 191.Google Scholar
[3]Simões, S., Viana, F., Volker, V., Koçak, M., Ramos, A. S., Vieira, M. T. & Vieira, M. F., Journal of Materials Science 45 (2010). p. 4351.CrossRefGoogle Scholar
[4]Simões, S., Viana, F., Ramos, A. S., Vieira, M. T. & Vieira, M. F., Microscopy and Microanalysis 21 (2015). p. 132.Google Scholar
[5] This research is sponsored by FEDER funds through the program COMPETE – Programa Operacional Factores de Competitividade – and by national funds through FCT – Fundação para a Ciência e a Tecnologia –, under the project PEst-C/EME/UI0285/2013.Google Scholar