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Characterization of Materials at the Nanoscale Using Hard X-ray Microspectroscopy Techniques

Published online by Cambridge University Press:  10 August 2018

Gema Martinez-CriadGema Martínez-Criado*
Affiliation:
Instituto de Ciencia de Materiales de Madrid (CSIC), 28049-Cantoblanco, Madrid, Spain Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Rémi Tucoulou
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Julie Villanova
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Damien Salomon
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Sylvain Labouré
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
*
* Corresponding author, gema.martinez.criado@csic.es

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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G. Martinez-Criado has been partially supported by the ESRF, CSIC & MINECO (EUIN-2017-88844)..Google Scholar