Hostname: page-component-788cddb947-m6qld Total loading time: 0 Render date: 2024-10-13T19:30:10.015Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Dislocation Structures in Hexagonal Close-Packed Metals by X-ray Line-Broadening Analysis

Published online by Cambridge University Press:  01 August 2002

M. Griffiths ,
D. Sage  and
D. Galindo
M. Griffiths
Affiliation:
Atomic Energy of Canada, Chalk River Laboratories, Chalk River, Ontario, K0J 1P0
D. Sage
Affiliation:
Atomic Energy of Canada, Chalk River Laboratories, Chalk River, Ontario, K0J 1P0
D. Galindo
Affiliation:
McGill University, Department of Mathematics, Montreal, Quebec

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 340 - 341
Copyright
Copyright © Microscopy Society of America 2002