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A Challenging to Characterization of Superconductors: Accurate Measurements of Charge Distribution and Interfacial Displacement

Published online by Cambridge University Press:  01 August 2002

Yimei Zhu ,
Lijun Wu  and
J. Tafto
Yimei Zhu
Affiliation:
Material Science Division, Brookhaven National Laboratory, Upton, NY 11973, USA
Lijun Wu
Affiliation:
Material Science Division, Brookhaven National Laboratory, Upton, NY 11973, USA
J. Tafto
Affiliation:
also Department of Physics, University of Oslo, P.O. Box 1048 Blindern, 0316 Oslo, Norway

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 386 - 387
Copyright
Copyright © Microscopy Society of America 2002