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Challenges and Applications of High Spatial and Energy Resolution EELS for Mapping Functional Chemistry in Beam-Sensitive Materials at Low Acceleration Voltages

Published online by Cambridge University Press:  05 August 2019

Quentin Ramasse ,
Demie Kepaptsoglou ,
Christian Vollmer ,
Fredrik Hage ,
Patricia Abellan  and
Jan Leitner
Quentin Ramasse*
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom School of Chemical and Process Engineering and School of Physics, University of Leeds, Leeds, United Kingdom
Demie Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom Department of Physics and JEOL Nanocentre, University of York, York, United Kingdom
Christian Vollmer
Affiliation:
Institut für Mineralogie, Westfälische Wilhelms-Universität, Münster, Germany
Fredrik Hage
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Patricia Abellan
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Jan Leitner
Affiliation:
Max Planck Institute for Chemistry, Mainz, Germany
*
*Corresponding author: qmramasse@superstem.org

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 480 - 481
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ramasse, Q, Ultramicroscopy 180 (2017), p. 41.Google Scholar
[2]Hage, F. et al. , Submitted (2019).Google Scholar
[3]Susi, T et al. , 2D Materials 4, 042004 (2017)Google Scholar
[4]Vollmer, C et al. , Meteoritics & Planetary Science 53(S1) (2018), p. 6109.Google Scholar
[5]Vollmer, C et al. , Submitted (2019).Google Scholar
[6]SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar