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Bayesian Analysis of Electron Spectroscopic SEM Images

Published online by Cambridge University Press:  01 August 2018

Jorg Eisele ,
Bernd Schindler ,
Dirk Preikszas  and
Rasmus R. Schroder
Jorg Eisele
Affiliation:
Centre for Advanced Materials (CAM), Universitat Heidelberg, Heidelberg, Germany
Bernd Schindler
Affiliation:
Carl Zeiss Microscopy, Oberkochen, Germany
Dirk Preikszas
Affiliation:
Carl Zeiss Microscopy, Oberkochen, Germany
Rasmus R. Schroder
Affiliation:
Centre for Advanced Materials (CAM), Universitat Heidelberg, Heidelberg, Germany Cryo Electron Microscopy, BioQuant, Universitatsklinikum Heidelberg, Heidelberg, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 574 - 575
Copyright
© Microscopy Society of America 2018 

References

[1] Schröder, R. R., et al Microscopy and Microanalysis Conference Proceedings of this conference.Google Scholar
[2] Steigerwald, M., et al, Frontiers of Characterization and Metrology for Nanoelectronics 2009.Google Scholar
[3] Cazaux, J. Ultramicroscopy 110 2010) p. 242.Google Scholar
[4] Carpenter, B., et al, Journal of Statistical Software 76 2017.Google Scholar
[5] Masters, R. C., et al, Nature Communications 6 2016) p. 6928.Google Scholar
[6] Pfannmoller, M., et al, Nano Letters 11 2011) p. 3099.Google Scholar
[7] Kammerer, J., et al Microscopy and Microanalysis Conference Proceedings of this conference.Google Scholar
[8]. The authors acknowledge funding of the DELTA project by the German Federal Ministry of Research and Education to RRS (FKZ: 13GW0044).Google Scholar