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AutoTEM 5 – Fully Automated TEM Sample Preparation for Materials Science

Published online by Cambridge University Press:  05 August 2019

M Dutka  and
A Prokhodtseva
M Dutka
Affiliation:
Thermo Fisher Scientific, Eindhoven, Netherlands.
A Prokhodtseva
Affiliation:
Thermo Fisher Scientific, Eindhoven, Netherlands.

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 554 - 555
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Giannuzzi, LA et al. , Introduction to Focused Ion Beams (Springer).Google Scholar
[2]Alvis, R et al. , 38th International Symposium for Testing and Failure Analysis (2012) p. 391.Google Scholar