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Automated Data Collection for Serial Section TEM

Published online by Cambridge University Press:  31 July 2006

D Fellmann
Affiliation:
Scripps Research Institute
J Pulokas
Affiliation:
Scripps Research Institute
B Carragher
Affiliation:
Scripps Research Institute
CS Potter
Affiliation:
Scripps Research Institute
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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Abstract
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© 2006 Microscopy Society of America

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