Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-23T20:54:37.173Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic-Resolution Characterization of Oxide-Metal Interfaces in Pt Precipitates in Sapphire Annealed at 1600°C

Published online by Cambridge University Press:  01 August 2010

MK Santala ,
VR Radmilovic ,
R Giulian ,
MC Ridgway ,
AM Glaeser  and
R Gronsky
MK Santala
Affiliation:
Lawrence Livermore National Laboratory
VR Radmilovic
Affiliation:
Lawrence Berkeley National Laboratory
R Giulian
Affiliation:
Australian National University, Australia
MC Ridgway
Affiliation:
Australian National University, Australia
AM Glaeser
Affiliation:
University of California, Berkeley
R Gronsky
Affiliation:
University of California, Berkeley

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1448 - 1449
Copyright
Copyright © Microscopy Society of America 2010