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Atomic ScaleIn SituElectron Microscopy: Challenges and Opportunities

Published online by Cambridge University Press:  25 July 2016

Joerg R. Jinschek
Joerg R. Jinschek*
Affiliation:
FEI Company, Materials Science BU, Eindhoven, The Netherlands

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 722 - 723
Copyright
© Microscopy Society of America 2016 

References

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[6] Schlossmacher, P., et al., Microscopy Today 18 (2010). p 14.Google Scholar
[7] Vendelbo, S.B., et al., Nature Materials 13 (2014). p 884.Google Scholar