Hostname: page-component-77c89778f8-m8s7h Total loading time: 0 Render date: 2024-07-19T14:57:39.112Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Scale Near-Edge Structures of a Structurally Abrupt Ni-SrTiO3 Interface

Published online by Cambridge University Press:  05 August 2019

Guillaume Radtke ,
Matthieu Bugnet ,
Quentin M. Ramasse ,
Marcel Hennes ,
Xiaorong Weng ,
Dominique Demaille ,
Yunlin Zheng  and
Franck Vidal
Guillaume Radtke
Affiliation:
Sorbonne Université, CNRS, IMPMC, Paris, France.
Matthieu Bugnet
Affiliation:
Univ Lyon, INSA Lyon, UCBL Lyon1, MATEIS, CNRS UMR 5510, Villeurbanne, France.
Quentin M. Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom. School of Physics and School of Chemical and Process Engineering, University of Leeds, Leeds, United Kingdom.
Marcel Hennes
Affiliation:
Sorbonne Université, CNRS, INSP, Paris, France.
Xiaorong Weng
Affiliation:
Sorbonne Université, CNRS, INSP, Paris, France.
Dominique Demaille
Affiliation:
Sorbonne Université, CNRS, INSP, Paris, France.
Yunlin Zheng
Affiliation:
Sorbonne Université, CNRS, INSP, Paris, France.
Franck Vidal
Affiliation:
Sorbonne Université, CNRS, INSP, Paris, France.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 664 - 665
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Schuler, V et al. , Nanotechnology 27 (2016), p. 495601.Google Scholar
[2]Leapman, RD et al. , Phys. Rev. B 26 (1982), p. 614.Google Scholar
[3]Radtke, G et al. , submitted (2019).Google Scholar
[4]STEM-EELS experiments were carried out at SuperSTEM, the EPSRC National Research Facility for Advanced Electron Microscopy. This work was supported by French state funds managed by the ANR within the Investissements d'Avenir programme (ANR-11-IDEX-0004-02), within the framework of the Cluster of Excellence MATISSE led by Sorbonne Universités. M. Hennes acknowledges financial support from the French Embassy in Berlin (Service pour la Science et la Technologie) and Campus France. X. Weng acknowledges financial support from China Scholarship Council (CSC).Google Scholar