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Atomic Scale Characterization of HgTe/CdTe Superlattices Using STEM Z-Contrast Imaging and VEELS

Published online by Cambridge University Press:  31 July 2006

L Fu ,
N Browning ,
H-S Jung  and
C Grein
L Fu
Affiliation:
University of California at Davis
N Browning
Affiliation:
University of California at Davis
H-S Jung
Affiliation:
EPIR Technologies Inc. USA
C Grein
Affiliation:
EPIR Technologies Inc. USA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 518 - 519
Copyright
© 2006 Microscopy Society of America