Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-19T02:59:56.740Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Resolution Z-contrast Imaging and EELS: Application for Ge/SiO2 Interface

Published online by Cambridge University Press:  24 July 2003

S. Lopatin ,
G. Duscher  and
W. Windl
S. Lopatin
Affiliation:
Department of Materials Science and Engineering, NC State University, Raleigh, NC 27695
G. Duscher
Affiliation:
Department of Materials Science and Engineering, NC State University, Raleigh, NC 27695 Oak Ridge National Laboratory, Oak Ridge, TN 37831
W. Windl
Affiliation:
Dept. of Materials Science and Engineering, Ohio State University, Columbus, OH 43210

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 818 - 819
Copyright
Copyright © Microscopy Society of America 2003