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Atomic Resolution Grain Boundary Analysis Using Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2010

PJ Felfer ,
SP Ringer  and
JM Cairney
PJ Felfer
Affiliation:
The University of Sydney, Australia
SP Ringer
Affiliation:
The University of Sydney, Australia
JM Cairney
Affiliation:
The University of Sydney, Australia

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1524 - 1525
Copyright
Copyright © Microscopy Society of America 2010