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Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

Published online by Cambridge University Press:  23 November 2012

J. Wen ,
D.J. Miller ,
N.J. Zaluzec ,
J.M. Hiller ,
R.E. Cook ,
A.B. Shah  and
J. Zuo
J. Wen
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, Argonne, IL
D.J. Miller
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, Argonne, IL
N.J. Zaluzec
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, Argonne, IL
J.M. Hiller
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, Argonne, IL
R.E. Cook
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, Argonne, IL
A.B. Shah
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, IL
J. Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, IL
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 384 - 385
Copyright
Copyright © Microscopy Society of America 2012

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