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Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

  • D.L. Medlin (a1), R. Fischer (a2), R. Gannon (a2), D.M. Hamann (a2) and D.C. Johnson (a2)...
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Corresponding author

*Corresponding author: dlmedli@sandia.gov

References

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[1]Johnson, D.C., Current Opinion in Solid State and Materials Science 3 (1998) 159-167.
[2]Merrill, D.R. et al. , Chemistry of Materials 27 (2015) 4066-4072.
[3]Alemayehu, M.B. et al. , Angewandte Chemie-International Edition 54 (2015) 15468-15472.
[4]Sutherland, D.R. et al. , Journal of the American Chemical Society 141 (2019) 922-927.
[5]DLM acknowledges support through Sandia National Laboratories, a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE NNSA under contract DE-NA-0003525. DCJ, RF, RG, and DMH acknowledge support from the National Science Foundation under grant DMR-1710214 and acknowledge the use of instrumentation in the Center for Advanced Materials Characterization in Oregon (CAMCOR) at the University of Oregon.

Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

  • D.L. Medlin (a1), R. Fischer (a2), R. Gannon (a2), D.M. Hamann (a2) and D.C. Johnson (a2)...

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