Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-23T19:39:22.642Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

Published online by Cambridge University Press:  05 August 2019

D.L. Medlin ,
R. Fischer ,
R. Gannon ,
D.M. Hamann  and
D.C. Johnson
D.L. Medlin*
Affiliation:
Sandia National Laboratories, 7011 East Avenue, MS 9161, Livermore, CA 94551 (USA).
R. Fischer
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
R. Gannon
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
D.M. Hamann
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
D.C. Johnson
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
*
*Corresponding author: dlmedli@sandia.gov

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2088 - 2089
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Johnson, D.C., Current Opinion in Solid State and Materials Science 3 (1998) 159-167.Google Scholar
[2]Merrill, D.R. et al. , Chemistry of Materials 27 (2015) 4066-4072.Google Scholar
[3]Alemayehu, M.B. et al. , Angewandte Chemie-International Edition 54 (2015) 15468-15472.Google Scholar
[4]Sutherland, D.R. et al. , Journal of the American Chemical Society 141 (2019) 922-927.Google Scholar
[5]DLM acknowledges support through Sandia National Laboratories, a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE NNSA under contract DE-NA-0003525. DCJ, RF, RG, and DMH acknowledge support from the National Science Foundation under grant DMR-1710214 and acknowledge the use of instrumentation in the Center for Advanced Materials Characterization in Oregon (CAMCOR) at the University of Oregon.Google Scholar