Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-16T11:08:10.685Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic electrostatic maps of sulfur vacancies in MoS2 by differential phase contrast

Published online by Cambridge University Press:  30 July 2021

Sebastian Calderon ,
Rafael Ferreira ,
Deepyanti Taneja ,
Jayanth Raghavendrarao ,
Langyan Zhou ,
Deji Akinwande  and
Paulo Ferreira
Sebastian Calderon
Affiliation:
International Iberian Nanotechnology Laboratory, Braga, Portugal
Rafael Ferreira
Affiliation:
International Iberian Nanotechnology Laboratory, Braga, Portugal
Deepyanti Taneja
Affiliation:
The University of Texas at Austin, United States
Jayanth Raghavendrarao
Affiliation:
The University of Texas at Austin, United States
Langyan Zhou
Affiliation:
The University of Texas at Austin, United States
Deji Akinwande
Affiliation:
The University of Texas at Austin, United States
Paulo Ferreira
Affiliation:
International Iberian Nanotechnology Laboratory, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1744 - 1745
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Müller-Caspary, K., Krause, F.F., Winkler, F., Béché, A., Verbeeck, J., Van Aert, S., Rosenauer, A., Ultramicroscopy. 203 (2019) 95–104. doi:10.1016/j.ultramic.2018.12.018.CrossRefGoogle Scholar
Lugg, N.R., Seki, T., Ishikawa, R., Findlay, S.D., Kohno, Y., Kanitani, Y., Tanaka, S., Tomiya, S., Ikuhara, Y., (2018). doi:10.1021/acsnano.8b03712.CrossRefGoogle Scholar
Ishikawa, R., Findlay, S.D., Seki, T., Sánchez-santolino, G., Ikuhara, Y., Shibata, N., Kohno, Y., Nat. Commun. (n.d.) 8–13. doi:10.1038/s41467-018-06387-8.CrossRefGoogle Scholar
Lazić, Ivan, Bosch, Eric G.T., Lazar, Sorin, Ultramicroscopy, Volume 160, 2016, Pages 265-280,CrossRefGoogle Scholar
Shibata, N.; Seki, T.; Sánchez-Santolino, G.; Findlay, S. D.; Kohno, Y.; Matsumoto, T.; Ishikawa, R.; Ikuhara, Y. Nat. Commun. 2017, 8, 15631.Google Scholar
Sánchez-Santolino, Gabriel, Lugg, Nathan R., Seki, Takehito, Ishikawa, Ryo, Findlay, Scott D., Kohno, Yuji, Kanitani, Yuya, Tanaka, Shinji, Tomiya, Shigetaka, Ikuhara, Yuichi, and Naoya Shibata, ACS Nano 2018 12 (9), 8875-8881Google Scholar