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Atom Probe Tomography of Oxidised Grain Boundaries in Highly Irradiated SS316

Published online by Cambridge University Press:  05 August 2019

Kristina Lindgren
Affiliation:
Chalmers University of Technology, Department of Physics, Göteborg, Sweden.
Anders Jenssen
Affiliation:
Studsvik Nuclear AB, Nyköping, Sweden.
Olof Tengstrand
Affiliation:
Studsvik Nuclear AB, Nyköping, Sweden.
Peter Ekström
Affiliation:
Swedish Radiation Safety Authority (SSM), Solna, Sweden.
Pål Efsing
Affiliation:
Ringhals AB, Väröbacka, Sweden. Royal Institute of Technology (KTH), Department of Solid Mechanics, Stockholm, Sweden.
Mattias Thuvander*
Affiliation:
Chalmers University of Technology, Department of Physics, Göteborg, Sweden.
*
*Corresponding author: mattias.thuvander@chalmers.se

Abstract

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Type
New Frontiers in Atom Probe Tomography Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Was, GS and Busby, JT, Philosophical Magazine 85 (2006), p. 443.CrossRefGoogle Scholar
[2]Kenik, EA and Busby, JT, Materials Science and Engineering: R: Reports 73 (2012), p. 67.CrossRefGoogle Scholar
[3]Toyama, T et al. , Journal of Nuclear Materials 418 (2011), p. 62.CrossRefGoogle Scholar
[4]Sample preparation at Studsvik Nuclear AB was funded by the Electric Power Research Institute (EPRI) and the Swedish Radiation Safety Authority (SSM), while SSM funded the APT analyses. The materials examined were provided by Ringhals AB. All these contributions are gratefully acknowledged.Google Scholar
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