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Microscopy and Microanalysis Microscopy and Microanalysis

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Assessing the Phase Accuracy of ePIE Reconstructions of Crystalline Materials

Published online by Cambridge University Press:  05 August 2019

Arthur M. Blackburn  and
Robert A. McLeod
Arthur M. Blackburn*
Affiliation:
University of Victoria, Centre for Advanced Materials and Related Technology, Victoria, BC, Canada.
Robert A. McLeod
Affiliation:
Entropy Reduction Algorithmics, Victoria, BC, Canada.
*
*Corresponding author: ablackbu@uvic.ca
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Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 70 - 71
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Maiden, AM and Rodenburg, JM, Ultramicroscopy 109 (2009), p. 1256.CrossRefGoogle Scholar
[2]π-Box, from Phase Focus Ltd, Sheffield, United Kingdom.Google Scholar
[3]Koch, C, PhD Thesis, Arizona State University (2002).Google Scholar
[4]Liu, C, Walther, T and Rodenburg, JM, Ultramicroscopy 109 (2009), p. 1263.CrossRefGoogle Scholar
[5]Plamann, T and Rodenburg, JM, Acta Crystallogr Sect A 54 (1998), p. 61.CrossRefGoogle Scholar
[6]Maiden, AM et al. , Ultramicroscopy 120 (2012), p. 64.CrossRefGoogle Scholar
[7]The collaboration with Hitachi High Technologies Canada in developing the software and incorporating the hardware on the HF3300V TEM used here is acknowledged with sincere thanks.Google Scholar
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