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Artifacts from the Electric Field build up in the Microbeam Analysis of Insulating Materials

Published online by Cambridge University Press:  01 August 2002

O. Jbara ,
M. Belhaj  and
S. Fakhfakh
O. Jbara
Affiliation:
LASSI/DTI UMR CNRS 6107, Faculté des Sciences BP 1039, 51687 REIMS CDX 2 France
M. Belhaj
Affiliation:
LASSI/DTI UMR CNRS 6107, Faculté des Sciences BP 1039, 51687 REIMS CDX 2 France
S. Fakhfakh
Affiliation:
LASSI/DTI UMR CNRS 6107, Faculté des Sciences BP 1039, 51687 REIMS CDX 2 France

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1460 - 1461
Copyright
Copyright © Microscopy Society of America 2002