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Applications of spherical aberration correction in STEM and TEM

Published online by Cambridge University Press:  01 August 2010

S Lazar ,
J Etheridge ,
C Dwyer ,
B Freitag  and
GA Botton
S Lazar
Affiliation:
Canadian Centre for Electron Microscopy, Canada
J Etheridge
Affiliation:
Monash University, Australia
C Dwyer
Affiliation:
Monash University, Australia
B Freitag
Affiliation:
FEI Electron Optics, The Netherlands
GA Botton
Affiliation:
McMaster University, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 68 - 69
Copyright
Copyright © Microscopy Society of America 2010