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Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Published online by Cambridge University Press:  26 July 2009

S Lazar
Affiliation:
McMaster University,Canada
L-Y Chang
Affiliation:
McMaster University,Canada
L Gunawan
Affiliation:
McMaster University,Canada
Y Shao
Affiliation:
McMaster University,Canada
GA Botton
Affiliation:
McMaster University,Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009