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Applications of 40-120kV Analytical TEM for Nanoscience

Published online by Cambridge University Press:  09 October 2013

T. Kubo ,
H. Kobayashi ,
T. Hashimoto ,
M. Okada ,
M. Kondo ,
K. Nakano ,
M. Wayama  and
T. Kamino
T. Kubo
Affiliation:
H. Kobayashi
Affiliation:
T. Hashimoto
Affiliation:
M. Okada
Affiliation:
M. Kondo
Affiliation:
K. Nakano
Affiliation:
M. Wayama
Affiliation:
T. Kamino
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1328 - 1329
Copyright
Copyright © Microscopy Society of America 2013