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Annular Bright Field STEM Investigation of the (0001) Stacking Fault in Alumina

Published online by Cambridge University Press:  25 July 2016

Eita Tochigi ,
Teruyasu Mizoguchi ,
Atsutomo Nakmura ,
Naoya Shibata  and
Yuichi Ikuhara
Eita Tochigi
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan
Teruyasu Mizoguchi
Affiliation:
Institute of Industrial Science, The University of Tokyo, Tokyo, Japan
Atsutomo Nakmura
Affiliation:
Department of Materials Science and Engineering, Nagoya University, Nagoya, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Japan Center for Elements Strategy Initiative for Structure Materials, Kyoto University, Kyoto, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1592 - 1593
Copyright
© Microscopy Society of America 2016 

References

[1] Mitchell, T. E., et al, Philos. Mag 34 (1976). p. 441.CrossRefGoogle Scholar
[2] Howitt, D. G. & Mitchell, T. E. Philos. Mag 44 (1981). p. 229.Google Scholar
[3] Findlay, S. D., et al., Appl. Phys. Lett 95 (2009) 191913.Google Scholar
[4] Tochigi, E., et al., Acta Mater 51 (2015). p. 152.Google Scholar
[5] The authors acknowledge funding from the Ministry of Education, Culture, Sports, Science, and Technology in Japan (Grant Nos. 25106003, 12024046 and the project of Elements Strategy Initiative for Structural Materials) and Japan Society for the Promotion of Science (Grant Nos. 15H02290, 15H04145 and 15K20959).Google Scholar