Hostname: page-component-59f8fd8595-p59nl Total loading time: 0 Render date: 2023-03-22T09:54:17.626Z Has data issue: true Feature Flags: { "useRatesEcommerce": false } hasContentIssue true
  • English

Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM

Published online by Cambridge University Press:  23 September 2015

Hirokazu Sasaki ,
Shinya Otomo ,
Ryuichiro Minato ,
Kazuo Yamamoto ,
Tsukasa Hirayama ,
Jun Yamasaki  and
Naoya Shibata
Hirokazu Sasaki
Affiliation:
Furukawa Electric Ltd., Yokohama and Japan.
Shinya Otomo
Affiliation:
Furukawa Electric Ltd., Yokohama and Japan.
Ryuichiro Minato
Affiliation:
Furukawa Electric Ltd., Yokohama and Japan.
Kazuo Yamamoto
Affiliation:
Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya and Japan.
Tsukasa Hirayama
Affiliation:
Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya and Japan.
Jun Yamasaki
Affiliation:
Osaka University, Osaka and Japan.
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo and Japan.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1975 - 1976
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Sasaki, H, et al, Microscopy 63 (2014) 235.CrossRefGoogle ScholarPubMed
[2] Yamasaki, J, et al, Appl. Phys. Lett. 101 (2012) 234105.CrossRefGoogle Scholar
[3] Dekkers, N. H. & de Lang, H., Optik 41, 452 (1974).Google Scholar