Hostname: page-component-7479d7b7d-rvbq7 Total loading time: 0 Render date: 2024-07-10T03:17:43.905Z Has data issue: false hasContentIssue false
  • English
  • Français

An Electron Microscopic Investigation of (1/3) < 0ī11 > Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects.

Published online by Cambridge University Press:  27 August 2014

D.L. Medlin ,
K.J. Erickson ,
S.J. Limmer ,
W.G. Yelton  and
M.P. Siegal
D.L. Medlin
Affiliation:
Sandia National Laboratories, Livermore, CA 94551, USA
K.J. Erickson
Affiliation:
Sandia National Laboratories, Livermore, CA 94551, USA
S.J. Limmer
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, USA
W.G. Yelton
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, USA
M.P. Siegal
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1088 - 1089
Copyright
Copyright © Microscopy Society of America 2014 

References

Hicks, L.D. & Dresselhaus, M.S. Phys. Rev. B 47 (24) (1993)16631.Google Scholar
Limmer, S.J, et al., J. Electrochem. Soc. 159 (4) (2012)D235. doi: 10.1149/2.084204jes.Google Scholar
Siegal, M.P., et al., J. Materials Research 29(2) (2014)182. doi: 10.1557/jmr.2013.370.Google Scholar
Medlin, D.L., et al., J. Materials Science, in press (2014).doi: 10.1007/s10853-014-8035-4.Google Scholar
Sandia National Laboratories is a multi-program laboratory managed and operated by SandiaCorporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department ofEnergy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar