Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-18T16:40:36.568Z Has data issue: false hasContentIssue false
  • English
  • Français

Aluminum Nanoparticles as Fiducials for Nanoscale Temperature Measurements

Published online by Cambridge University Press:  25 July 2016

Matthew Mecklenburg ,
Brian Zutter  and
B. C. Regan
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, USA
Brian Zutter
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA
B. C. Regan
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 830 - 831
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Mecklenburg, M, et al, Science 347 (2015). p. 629–632.Google Scholar
[2] Meyer, G Zeitschrift fur Physik 148 (1957). p. 61–71.Google Scholar
[3] Wilson, A J C Proceedings of the Physical Society 54 (1941). p. 235–244.Google Scholar
[4] This work was supported in part by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA. The data were acquired at the FEI NanoPort (Oregon, USA) using a FEI Titan Themis 80-200.Google Scholar