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Adventures in 4D-STEM - Underpinned by the Legacy of JCH Spence

Published online by Cambridge University Press:  22 July 2022

J. Etheridge ,
W. Chao ,
B. Esser ,
W. Li ,
T. Petersen  and
C.L Zheng
J. Etheridge*
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC, Australia Dept of Materials Science and Metallurgy, Monash University, VIC, Australia
W. Chao
Affiliation:
Dept of Materials Science and Metallurgy, Monash University, VIC, Australia
B. Esser
Affiliation:
Dept of Materials Science and Metallurgy, Monash University, VIC, Australia
W. Li
Affiliation:
Dept of Materials Science and Metallurgy, Monash University, VIC, Australia
T. Petersen
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC, Australia
C.L Zheng
Affiliation:
State Key Laboratory of Surface Physics and Dept of Physics, Fudan University, Shanghai, China
*
*Corresponding author: joanne.etheridge@monash.edu

Abstract

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Type
Memorial Symposium: John C.H. Spence
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2756
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Copyright
Copyright © Microscopy Society of America 2022

References

Spence, JCH and Zuo, JM in “Electron Microdiffraction” (Plenum Publishing Corporation, New York).Google Scholar
Cowley, JM and Spence, JCH, Ultramicroscopy 2 (1979 ), p. 433.Google Scholar
Cowley, JM and Spence, JCH, Ultramicroscopy 6 (1981), p. 359.CrossRefGoogle Scholar
Zuo, JM and Spence, JCH, Philosophical Magazine A68 (1993), p. 1055.CrossRefGoogle Scholar
Spence, JCH, Qian, W and Silverman, MP, Journal of Vacuum Science & Tech A12 (1994), p. 542.CrossRefGoogle Scholar
Spence, JCH and Cowley, JM, Optik 50 (1978), p. 129.Google Scholar
Marchesini, S et al. , Optics Express 11 (2003), p. 2344.CrossRefGoogle Scholar
The authors acknowledge funding from the Australian Research Council project grant numbers DP160104679, DP200103070, and infrastructure grants for the Titan3 80-300 FEG-TEM (LE0454166) and the Spectra Phi FEG-TEM (LE170100118) and are grateful for access to the facilities and expert staff at the Monash Centre for Electron Microscopy.Google Scholar