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Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction

Published online by Cambridge University Press:  27 August 2014

F. Bauer ,
S. Sitzman ,
C. Lang ,
C. Hartfield  and
J. Goulden
F. Bauer
Affiliation:
Oxford Instruments GmbH, Wiesbaden, Germany
S. Sitzman
Affiliation:
Oxford Instruments America, Concord, MA, USA
C. Lang
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
C. Hartfield
Affiliation:
Oxford Instruments NanoAnalysis, 10410 Miller Rd., Dallas, TX, USA
J. Goulden
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 326 - 327
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Keller, R.R., Geiss, R.H. Transmission EBSD from 10nm domains in a scanning electron microscope, Journal of Microsopy 245 (2012) 245-251.Google Scholar
[2] Trimby, P.W. Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope, Ultramicrosopy 120 (2012) 16-24.Google Scholar