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Advances in Serial Block Face Dualbeam Electron Microscopy for the Exploration of Cortical Circuits

Published online by Cambridge University Press:  05 August 2007

B Lich  and
G Knott
B Lich
Affiliation:
FEI Company,Netherlands
G Knott
Affiliation:
University of Lausanne,Switzerland
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 238 - 239
Copyright
© 2007 Microscopy Society of America

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