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Ad Hoc Determination of Local Misorientations and Boundary Planes between Grains in TEM by a Dedicated Software Package Developed for the Gatan DigitalMicrograph Platform

Published online by Cambridge University Press:  27 August 2014

C. A. Wade  and
M. Watanabe
C. A. Wade
Affiliation:
Dept. of Mater. Sci. & Eng., Lehigh University, Bethlehem, PA
M. Watanabe
Affiliation:
Dept. of Mater. Sci. & Eng., Lehigh University, Bethlehem, PA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1078 - 1079
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Young, C.T. & Steele, J.H. JR, and J.L Lytton, Met. Trans. 4 (1973), 2081.Google Scholar
[2] The authors wish to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229.Google Scholar