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Active Pixel Sensors for Direct Imaging Of Electrons From 10 keV Up To Several MeV With Large Dynamic Range for TEM Applications

Published online by Cambridge University Press:  09 October 2013

L. Strueder ,
G. Lutz ,
S. Aschauer ,
P. Majewski ,
J. Treis ,
K. Hermenau ,
H. Ryll  and
H. Soltau
L. Strueder
Affiliation:
G. Lutz
Affiliation:
S. Aschauer
Affiliation:
P. Majewski
Affiliation:
J. Treis
Affiliation:
K. Hermenau
Affiliation:
H. Ryll
Affiliation:
H. Soltau
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1150 - 1151
Copyright
Copyright © Microscopy Society of America 2013