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Accurate X-ray Mapping and Quantitative Analysis at Tilted Geometries

Published online by Cambridge University Press:  23 November 2012

S. Burgess ,
P. Statham ,
J. Holland ,
C. Lang  and
S. Bhattiprolu
S. Burgess
Affiliation:
Oxford instruments, High wycombe, United Kingdom
P. Statham
Affiliation:
Oxford instruments, High wycombe, United Kingdom
J. Holland
Affiliation:
Oxford instruments, High wycombe, United Kingdom
C. Lang
Affiliation:
Oxford instruments, High wycombe, United Kingdom
S. Bhattiprolu
Affiliation:
Oxford Instruments, Concord, MA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1012 - 1013
Copyright
Copyright © Microscopy Society of America 2012

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