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Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy

  • Zhen Chen (a1), Adrian J. D'Alfonso (a2), Matthew Weyland (a3) (a4), Daniel J. Taplin (a1), Scott D. Findlay (a1) and Leslie J. Allen (a2)...
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References

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[1] Goldstein, JI, et al in "Principles of Analytical Electron Microscopy" (ed. D.C. Joy et al, Plenum Press, New York (1986). p. 155.
[2] D'Alfonso, AJ, et al, Phys. Rev. B 81 (2010) 100101. (R).
[3] Chu, M, et al, Phys. Rev. Lett. 104 (2010) 196101.
[4] Kotula, PG, et al, Microscopy and Microanalysis 18 (2012). p. 691.
[5] Kothleitner, G, et al, Phys. Rev. Lett. 112 (2014) 085501.
[6] Chen, Z, et al, Submitted for publication (2014.
[7] LeBeau, JM, et al, Ultramicroscopy 110 (2010). p. 118.
[8] Allen, LJ, et al, Ultramicroscopy (in press 2015). doi:10.1016/j.ultramic.2014.10.011..
[9] LeBeau, JM, et al, Phys. Rev. Lett. 100 (2008) 206101.
[10] The authors thank Dr N.J. Zaluzec, Argonne National Laboratory, and A. Sandborg, EDAX Inc., for assistance with the geometry of our EDX detector. This research was supported by the Australian Research Council under the Discovery Projects funding scheme (Projects DP110102228 and 140102538), its DECRA funding scheme (Project DE130100739) and its LIEF funding scheme (Project LE0454166)..

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