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Insights into the Electronic Structure of Ceramics through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy

Published online by Cambridge University Press:  07 August 2002

Harald Müllejans  and
Roger H. French
Harald Müllejans*
Affiliation:
Max-Planck-Institut für Metallforschung, Seestraβe 92, D-70174 Stuttgart, Germany Institute for Advanced Materials, Joint Research Centre, European Commission, P.O. Box 2, NL-1755 ZG Petten, The Netherlands
Roger H. French
Affiliation:
Max-Planck-Institut für Metallforschung, Seestraβe 92, D-70174 Stuttgart, Germany DuPont Central Research, E356-384 Experimental Station, Wilmington, DE 19880
*
*Corresponding author, at the Institute for Advanced Materials, Joint Research Centre, European Commission, P.O. Box 2, NL-1755 ZG Petten, The Netherlands.
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Abstract

Valence electron energy-loss (VEEL) spectroscopy was performed on six ceramic materials in a dedicated scanning transmission electron microscope (STEM). Quantitative analysis of these data is described yielding access to the complex optical properties and the electronic structure of the materials. Comparisons are made on the basis of the interband transition strength describing transitions between occupied states in the valence band and empty states in the conduction band. This proves that the quantitative analysis of VEEL data is a competitive and complementary method to be considered when investigating the electronic structure of materials. Possibilities for improvement and extension of the analysis are discussed extensively.

Keywords

scanning transmission electron microscopevalence electron energy-loss spectroscopyceramicselectronic structureoptical propertiesdata analysisinterband transition strengthquantitative analysis
Type
Research Article
Information
Microscopy and Microanalysis , Volume 6 , Issue 4 , July 2000 , pp. 297 - 306
Copyright
Copyright © Microscopy Society of America 2000

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