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Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM

Published online by Cambridge University Press:  02 July 2010

Sorin Lazar
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, Canada FEI Electron Optics, 5600 KA Eindhoven, The Netherlands
Yang Shao
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, Canada
Lina Gunawan
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, Canada
Riad Nechache
Affiliation:
INRS-Énergie, Matériaux et Télécommunications, Varennes, Québec J3X 1S2, Canada
Alain Pignolet
Affiliation:
INRS-Énergie, Matériaux et Télécommunications, Varennes, Québec J3X 1S2, Canada
Gianluigi A. Botton
Affiliation:
Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, Canada
Corresponding
E-mail address:

Abstract

High-angle annular dark-field and annular bright-field imaging experiments were carried out on an aberration-corrected transmission electron microscope. These techniques have been demonstrated on thin films of complex oxides Ba3.25La0.75Ti3O12 and on LaB6. The results show good agreement between theory and experiments, and for the case of LaB6 they demonstrate the detection of contrast from the B atoms in the annular bright-field images. Elemental mapping with electron-energy-loss spectroscopy has been used to deduce the distribution of Cr and Fe in a thin film of the complex oxide Bi2(Fe1/2Cr3/2)O6 at the unit cell level and the changes in the near-edge structure within the inequivalent regions in the crystalline unit cell. Energy-filtered images in the low-loss region of the energy-loss spectrum show contrast and resolution consistent with the modulation of the signals from elastic scattering. High-resolution contrast, mediated by phonon scattering, is observed for interband transitions. The limitations in terms of detection and signal are discussed.

Type
Special Section—Aberration-Corrected Electron Microscopy
Copyright
Copyright © Microscopy Society of America 2010

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Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM
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