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Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data

Published online by Cambridge University Press:  14 March 2017

Andrew J. Breen*
Affiliation:
Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia
Katharina Babinsky
Affiliation:
Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef Straße 18, 8700 Leoben, Austria
Alec C. Day
Affiliation:
Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia
K. Eder
Affiliation:
Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia
Connor J. Oakman
Affiliation:
Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia
Patrick W. Trimby
Affiliation:
Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia
Sophie Primig
Affiliation:
School of Materials Science and Engineering, The University of New South Wales, Sydney, NSW 2052, Australia
Julie M. Cairney
Affiliation:
Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia
Simon P. Ringer*
Affiliation:
Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia Australian Institute for Nanoscale Science and Technology, School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia
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Abstract

Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail. For the first time, the accuracy of crystallographic measurements made using APT will be independently verified using TKD. Experimental data from two atom probe tips, one a nanocrystalline Al–0.5Ag alloy specimen collected on a straight flight-path atom probe and the other a high purity Mo specimen collected on a reflectron-fitted instrument, will be compared. We find that the average minimum misorientation angle, calculated from calibrated atom probe reconstructions with two different pole combinations, deviate 0.7° and 1.4°, respectively, from the TKD results. The type of atom probe and experimental conditions appear to have some impact on this accuracy and the reconstruction and measurement procedures are likely to contribute further to degradation in angular resolution. The challenges and implications of this correlative approach will also be discussed.

Type
New Approaches and Correlative Microscopy
Copyright
© Microscopy Society of America 2017 

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References

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