Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-12-03T19:17:56.219Z Has data issue: false hasContentIssue false

Axiotaxy of CrSi2 on Si(001); from the Micrometer- to the Angstrom-Scale

Published online by Cambridge University Press:  07 September 2007

M Falke
Affiliation:
University of Technology Chemnitz,Germany
H Schletter
Affiliation:
University of Technology Chemnitz,Germany
O Filonenko
Affiliation:
University of Technology Chemnitz,Germany
A Mogilatenko
Affiliation:
University of Technology Chemnitz,Germany
G Beddies
Affiliation:
University of Technology Chemnitz,Germany
S Schulze
Affiliation:
University of Technology Chemnitz,Germany
M Hietschold
Affiliation:
University of Technology Chemnitz,Germany
A Bleloch
Affiliation:
Daresbury Laboratory of University of Liverpool,U.K.
K De Keyser
Affiliation:
Ghent University,Belgium
C Detavernier
Affiliation:
Ghent University,Belgium
Get access

Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)